XRF(X射线荧光灯)
用于测量纯度或成分。大致金属 样品没有快速损失,仅分析了最大100微米的样品外表面成分。与事实有些偏差 这将取决于表面的性质。物体形状 以及校准中使用的标准示例
激光刻印
激光刻印
用于雕刻消息 或贵金属制成的珠宝上的符号 您可以选择样式和尺寸。通过在计算机上具有“字体”或“徽标”来根据需要选择文本 否则,客户必须将字体文件带到徽标中,它应该是Adobe llustrator或Corel Draw文件。
消防检查
消防检查
Gemological Instruments
Basic Instruments
Refractometer, polariscope, gemological microscope, 10x loupe, specific gravity balance, daylight & UV lamps, hand spectroscope, Chelsea color filter, dichroscope, fiber-optic light. These are basic instruments used in the establishing the general gemological features of the gem in question.
Advanced Instruments
The following instruments are used for in-depth analysis of gemstones and are at the cutting edge of gemology. Only a handful of labs around the world have access to these tools, each of which is present in the GIT Gem Testing Center.
Energy Dispersive X-Ray Fluorescence Spectrometer (EDXRF)
· Distinguishing between synthetic and natural gemstones
· Analyzing quality enhancement methods of specific gemstones
· Analyzing elements to identify the geographical origin of the gemstones